Keysight Nano Measurement Seminar Modern Media Systems and Keysight Technologies will conduct a Nano Measurement presentation at KAUST to discuss their recent developments in Scanning Probe Microscopy (SPM) – Atomic Force Microscopy (AFM), Nanoindentation and Field Emission Scanning Electron Microscopy (FE-SEM).
Sunday, October 26, 9:00 a.m.
Ibn Al-Haytham (building 2), Level 5, Room 5209
Keysight’s SPM technology specializes in high resolution imaging, liquid imaging, environmental control, temperature control, electrical properties measurements and electrochemistry. Keysight will introduce their new 7500 SPM and a new technique, Scanning Electrochemical Microscopy (SECM).
In addition, they will present on their new Express Test application for performing quasi-static indents at speeds up to 1 indent per second. They will also discuss new developments in their Field Emission SEM, including applications in the areas of shale and ‘mud logging’.
This special event offers a unique opportunity to learn about the latest developments from Keysight’s Nanotechnology Measurement Division. A question and answer discussion will be held following the presentation.
For more information, please email long.chen@kaust.edu.sa or call 808 2342.
